WTW 2009 - Call for Papers

CALL FOR PAPERS

Scope -- Submissions -- Key Dates -- Additional Information -- Committees

Scope

The Wireless Test Workshop (WTW2008) is an IEEE-sponsored workshop devoted to exploring all issues relating to the design and especially test of wireless circuits and systems. It is the unique workshop dedicated to RF testing. The workshop will be held the day before the VLSI Test Symposium (VTS) 2009.

All topics relating to design and test of RF circuits and systems are of interest, including:

Design-for-testability
RF wafer probing
High frequency test
Yield learning and analysis
Wireless test methodology
Case studies
Wireless system test
Embedded RF circuit test
Standards conformance test
Design characterization and validation
Noise analysis and avoidance
Design-for-manufacturability
Test board related issues
Test equipment and metrology
Alternative test methods
Cost of test
Fault diagnosis and failure analysis

Tutorial and panel proposals will also be considered.

Submissions

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To present recent results at the workshop, please submit an extended abstract of between 500 and 1000 words to the program chair (PDF or Word versions through email are preferred). The abstract should clearly describe the nature of the contribution, the method, results, originality, significance, and superiority over other methods. The name, address, phone number and email address of the presenter should also be included. Informal proceedings of the workshop will be distributed to attendees.

Please submit your paper proposal to the Program Chair.

Key Dates

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Submission deadline: February 27th, 2009
Notification of acceptance: March 20th, 2009
Final copy deadline: April 10th, 2009

Additional Information

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Mustapha Slamani
IBM
MailStop 964Z
1000 River Street
Essex Junction, VT, 05452
Tel: (802)-769-0676
E-Mail: Slamanim@us.ibm.com

Committees

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General Chair
R. Aitken,ARM, USA

Program Chair
M. Slamani, IBM, USA

General Co-Chair
S. Ozev, ASU, USA

ProgramCo-Chair
W.R. Eisenstadt, Univ. of Florida, USA

Publicity Chair
A. Khoche, Verigy, USA

Finance Chair
I. Sylla, TI, USA

Program Committee
S. Abdennadher, Intel
K. Arabi, Qualcomm
A. Chatterjee, Georgia Tech.
S. Bernard, LIRMM
J. Bhagat, IBM
E. Acar, Intel
M. Fennelly, Roos Inst,
C. Force, TI
H. Haggag, Intersil
C. Kelma, NXP
Y-Bu Kim, Samsung
S. Lazar, TI
J. Li, Silicon Labs
L. Luce, Teradyne
Y. Makris, Yale Univ.
M. Margala, Univ. of Massachusetts Lowell
C. Montiel, TI
C. Moore, Maxim
U. Natarajan, Intel
R. Rajsuman, SanJose S. Univ.
J. Rivoir, Verigy
G. Roberts, McGill Univ
E. Silva, NSC
F. Taenzler, TI
C. Thibeault, ETS
G. Verma, Qualcomm
T. Xia, Univ. of Vermon

For more information, visit us on the web at: http://www.event URL.com

The 8th Workshop on Test of Wireless Circuits and Systems (WTW 2009 ) is sponsored by the Institute of Electrical and Electronics Engineers (IEEE) Computer Society's Test Technology Technical Council (TTTC).